CfP - VALID 2009 | September 20-25, 2009 - Porto, Portugal

CfP - VALID 2009 | September 20-25, 2009 - Porto, Portugal

From: Andrea Baruzzo <>
Date: Mon, 2 Feb 2009 14:26:12 +0100
Message-ID: <>
Please consider to contribute to and/or forward to the appropriate
groups the following opportunity to submit and publish original
scientific results.

============== VALID 2009 | Call for Papers ===============


VALID 2009:  The First International Conference on Advances in System
Testing and Validation Lifecycle

September 20-25, 2009 - Porto, Portugal

General page:

Call for Papers:

Submission deadline: April 20, 2009

Technically Co-sponsored by the IEEE Computer Society - Portugal Chapter

Sponsored by IARIA,

Submissions will be peer-reviewed, published by IEEE CPS, posted in
IEEE Digital Library, and indexed with the major indexes.

Extended versions of selected papers will be published in IARIA

Please note the Poster Forum and Work in Progress track.

The topics suggested by the conference can be discussed in term of
concepts, state of the art, research, standards, implementations,
running experiments, applications, and industrial case studies.
Authors are invited to submit complete unpublished papers, which are
not under review in any other conference or journal in the following,
but not limited to, topic areas.

All tracks are open to both research and industry contributions, in
terms of Regular papers, Posters, Work in progress,
Technical/marketing/business presentations, Demos, Tutorials, and

VALID 2009 Tracks (submission details: see CfP on the site)

- Robust design methodologies

Designing methodologies for robust systems; Secure software
techniques; Industrial real-time software; Defect avoidance; Cost
models for robust systems; Design for testability; Design for
reliability and variability; Design for adaptation and resilience;
Design for fault-tolerance and fast recovery; Design for
manufacturability, yield and reliability; Design for testability in
the context of model-driven engineering

- Vulnerability discovery and resolution

Vulnerability assessment; On-line error detection; Vulnerabilities in
hardware security; Self-calibration; Alternative inspections;
Non-intrusive vulnerability discovery methods; Embedded malware

- Defects and Debugging

Debugging techniques; Component debug; System debug; Software debug;
Hardware debug; System debug; Power-ground defects; Full-open defects
in interconnecting lines; Physical defects in memories and
microprocessors; Zero-defect principles

- Diagnosis

Diagnosis techniques; Advances in silicon debug and diagnosis; Error
diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical
diagnostics; Testability and diagnosability; Diagnosis and testing in
mo bile environments

- System and feature testing

Test strategy for systems-in-package; Testing embedded systems;
Testing high-speed systems; Testing delay and performance; Testing
communication traffic and QoS/SLA metrics; Testing robustness;
Software testing; Hardware testing; Supply-chain testing; Memory
testing; Microprocessor testing; Mixed-signal production test; Testing
multi-voltage domains; Interconnection and compatibility testing

- Testing techniques and mechanisms

Fundamentals for digital and analog testing; Emerging testing
methodologies; Engineering test coverage; Designing testing suites;
Statistical testing; Functional testing; Parametric testing; Defect-
and data-driven testing; Automated testing; Embedded testing;
Autonomous self-testing; Low cost testing; Optimized testing; Testing
systems and devices; Test standards

- Software verification and validation

High-speed interface verification and fault-analysis; Software testing
theory and practice; Model-based testing; Verification metrics;
Service/application specific testing; Model checking; OO software
testing; Testing embedded software; Quality assurance; Empirical
studies for verification and validation; Software inspection
techniques; Software testing tools; New approaches for software
reliability verification and validation

- Testing and validation of run-time evolving systems

Automated testing for run-time evolving systems; Testing and
validation of evolving systems; Testing and validation of
self-controlled systems; Testing compile-time versus run-time
dependency for evolving systems; On-line validation and testing of
evolving at run-time systems; Modeling for testability of evolving at
run-time systems; Near real-time and real-time monitoring of run-time
evolving systems; Verification and validation of reflective models for
testing; Verification and validation of fault tolerance in run-time
evolving systems

- Feature-oriented testing

Testing user interfaces and user-driven features; Privacy testing;
Ontology accuracy testing; Testing semantic matching; Testing
certification processes; Testing authentication mechanisms; Testing
biometrics methodologies and mechanisms; Testing cross-nation systems;
Testing system interoperability; Testing system safety; Testing system
robustness; Testing temporal constraints; Testing transaction-based
properties; Directed energy test capabilities /microwave, laser,
etc./; Testing delay and latency metrics

- Domain-oriented testing

Testing autonomic and autonomous systems;  Testing intrusion
prevention systems; Firewall testing;  Information assurance testing;
Testing social network systems; Testing recommender systems; Testing
biometric systems;  Testing diagnostic systems; Testing on-line
systems; Testing financial systems; Testing life threatening systems;
Testing emergency systems; Testing satellite and wireless systems;
Testing mobile environments; Testing RFID systems; Testing
sensor-based systems; Testing testing systems


VALID Advisory Chairs

Andrea Baruzzo, Università degli Studi di Udine, Italy

Mikey Browne, IBM, USA

Petre Dini, Cisco Systems, Inc., USA / Concordia University, Canada

VALID 2009 Publicity Chairs

Sérgio Soares, University of Pernambuco, Brazil

Stephan Weißleder, Humboldt-Universität zu Berlin" and "Fraunhofer
FIRST", Germany

VALID 2009 Research-Industry Chairs

Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada

Kazumi Hatayama, Semiconductor Technology Academic Research Center
(STARC), Japan

Krzysztof Rogoz, Motorola, Poland

Rajarajan Senguttuvan, Texas Instruments USA

Anne Meixner, Intel-Oregon, USA

VALID 2009 Program Committee


Moonzoo Kim, KAIST, South Korea

Cecilia Metra, DEIS-ARCES-University of Bologna, Italy

Bart Vermeulen, NXP Semiconductors, The Netherlands

Committee members:
Received on Mon 02 Feb 2009 - 13:26:13 GMT